3.3.3.106. NXxas_tey¶
Status:
application definition (contribution), extends NXxas
Description:
In total electron yield (TEY), the XAS spectrum is measured by ...
In total electron yield (TEY), the XAS spectrum is measured by collecting all secondary electrons emitted from the sample surface. The drain current or total electron current \(I_{ey}\) is proportional to the absorption coefficient:
\[\mu(E) \propto I_{ey}/I_0\]TEY is inherently surface-sensitive because electrons are readily absorbed by most materials, limiting the probing depth to a few nanometers.
The top-level intensity field stores the ratio \(I_{ey}/I_0\). When the raw detector data and processing steps are available, they can be stored in the optional
NXinstrumentandNXprocessgroups, enabling full reproducibility of the data reduction.
Symbols:
No symbol table
- Groups cited:
Structure:
definition: (required) NX_CHAR ⤆
Official NeXus NXDL schema to which this file conforms. ...
Official NeXus NXDL schema to which this file conforms.
Obligatory value:
NXxas_teyintensity: (required) NX_FLOAT (Rank: 1, Dimensions: [nEnergy]) {units=NX_ANY} ⤆
The absorption coefficient :math:`\mu(E) \propto I_{ey}/I_0`, ...
The absorption coefficient \(\mu(E) \propto I_{ey}/I_0\), where \(I_{ey}\) is the total electron yield signal.
INSTRUMENT: (optional) NXinstrument ⤆
PROCESS: (optional) NXprocess ⤆
Description of how :ref:`intensity ...
Description of how intensity was obtained from the raw detector data (i0, iey).
Name of the program used for processing.
Version of the program used for processing.
date: (optional) NX_DATE_TIME ⤆
Date and time of processing.
Hypertext Anchors¶
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